Application of a microfocus Laue technique to the study of deformation in aluminium single crystals

This publication has 6 references indexed in Scilit:

• Lineage Structure in Aluminum Single Crystals
  JOM, 1955
• The study of semiconductor crystal perfection by X-ray diffraction methods
  British Journal of Applied Physics, 1955
• Method of Using a Fine-Focus X-ray Tube for Examining The Surface of Single Crystals
  JOM, 1954
• The Slip, Twinning, Cohesion, Growth and Boundaries of Crystals
  Proceedings of the Physical Society. Section A, 1951
• Sur deux variantes de la méthode de Laue et leurs applications
  Acta Crystallographica, 1949
• Über eine röntgenographische Methode zur Untersuchung von Gitterstörungen an Kristallen
  The Science of Nature, 1931