A Nonparametric Multiclass Pattern Classifier
- 1 June 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Systems, Man, and Cybernetics
- Vol. 9 (6) , 345-352
- https://doi.org/10.1109/TSMC.1979.4310223
Abstract
A nonparametric multiclass classifier is presented. Each pattern class is described by hyperrectangles in the measurement space. These hyperrectangles are generated by the basic event generation (BEG) algorithm which realizes set theoretical training set reduction. The classification of new patterns is performed by examining which basic event includes the patterns. The experimental results indicate that the classifier is effective.Keywords
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