Characterization of molecular beam epitaxy grown CdF2 layers by x-ray diffraction and CaF2:Sm photoluminescence probe
- 1 November 1995
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology A
- Vol. 13 (6) , 2703-2708
- https://doi.org/10.1116/1.579471
Abstract
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