Influence of workload on error recovery in random access memories

• 1 April 1988
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
• Vol. 37  (4) , 500-507
• https://doi.org/10.1109/12.2199

Abstract

Keywords

• TRANSIENT ERRORS
• ABILITY TO RECOVER
• STOCHASTIC
• SE/SC
• STANDARD MEMORY
• SYSTEM WORKLOAD
• EXERCISING