Application of X-ray photoelectron spectroscopy and fourier transform IR-reflection absorption spectroscopy to studies of the composition of Langmuir-Blodgett films
- 1 May 1988
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 159 (1-2) , 267-273
- https://doi.org/10.1016/0040-6090(88)90638-4
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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