Development of an optical model for steady state porous anodic films on aluminium formed in phosphoric acid

This publication has 12 references indexed in Scilit:

• The use of impedance spectroscopy and optical reflection spectroscopy to study modified aluminium surfaces
  Electrochimica Acta, 1996
• Optical Transmittance of Anodically Oxidized Aluminum Alloy
  Japanese Journal of Applied Physics, 1995
• Characterization of different conversion coatings on aluminium with spectroscopic ellipsometry
  Thin Solid Films, 1993
• Spectroscopic ellipsometry characterization of anodic films on aluminium correlated with transmission electron microscopy and Auger electron spectroscopy
  Surface and Interface Analysis, 1992
• Characterization of various aluminium oxide layers by means of spectroscopic ellipsometry
  Applied Physics A, 1992
• Ellipsometric analysis for surface roughness and texture
  Applied Optics, 1988
• Optical properties of thin films
  Thin Solid Films, 1982
• Self-consistent approach to electromagnetic wave propagation in composite media: Application to model granular metals
  Physical Review B, 1978
• Light scattering in porous anodic aluminium oxide films II. Polarization effects
  Thin Solid Films, 1972
• Ellipsometry of Anisotropic Films
  Journal of the Optical Society of America, 1971