The performance and evaluation of thin film insulating crossovers
- 1 August 1968
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 7 (3) , 213-232
- https://doi.org/10.1016/0026-2714(68)90014-0
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Evaporant Sources for the Deposition of Pinhole-Free FilmsReview of Scientific Instruments, 1963