The effects of thermal silicidation of the current transport characteristics of Ti/〉111〈Si Schottky-barrier contacts
- 1 January 1988
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 31 (1) , 35-44
- https://doi.org/10.1016/0038-1101(88)90083-4
Abstract
No abstract availableKeywords
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