An improvement of nanosecond fluorimeters to overcome drift problems

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Abstract
For the processing of fluorescence decay data it is often necessary to obtain the time profile of the flash lamp which excites the fluorescence as well as the variation with time of the fluorescence intensity. If these intensity profiles are collected in consecutive experiments, instrumental drift may introduce serious errors. This problem is shown to be minimized by alternate collection of the data for the fluorescence and for the excitation lamp. An automatic setup for performing such experiments is outlined.