Measurement of on-chip waveforms and pulse propagation in digital GaAs integrated circuits by picosecond electro-optic sampling
- 27 February 1986
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 22 (5) , 264-265
- https://doi.org/10.1049/el:19860181
Abstract
We demonstrate precise measurement of sub-100 ps rise time on-chip electrical waveforms and of pulse propagation in digital GaAs integrated circuits with the use of picosecond electro-optic sampling. These experiments yield the first non-invasive measurement of single-gate propagation delays via direct and precise observation of on-chip waveforms at the input and output of individual logic gates internal to an integrated circuit.Keywords
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- A New Technique for Measurement of Raman Dephasing Dynamics and Recent Advances in cw Mode-Locked Dye LasersPublished by Springer Nature ,1978