Determination of the morphology of Ag deposits by photoreflectance
- 15 July 1994
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 50 (3) , 1973-1975
- https://doi.org/10.1103/physrevb.50.1973
Abstract
The optical response of one Ag monolayer deposited on different Si surfaces has been studied by differential reflectance spectroscopy. The observation of the plasma resonance in the Ag deposits and its energy position, or the nonobservation of this plasma resonance, allows a qualitative determination of the morphology of the thin Ag film: either continuous or formed by quasispherical particles or by flattened three-dimensional particles.Keywords
This publication has 11 references indexed in Scilit:
- Optical properties of thin discontinuous metal filmsJournal of Physics: Condensed Matter, 1991
- Optical study of Ag overlayers deposited on Si(111)-7 × 7 as a function of temperatureVacuum, 1990
- Roughness induced at Si(111) surfaces by high temperature heatingApplied Surface Science, 1990
- Adsorbed layer and thin film growth modes monitored by Auger electron spectroscopySurface Science Reports, 1989
- Comparative study of Ag growth on (111) Au and Cu substratesPhysical Review B, 1988
- Blue shift of the dipolar plasma resonance in small silver particles on an alumina surfacePhysical Review B, 1986
- Reflectivity of Ag layers on Al substrateSolid State Communications, 1982
- Optical evidence for longitudinal waves in very thin Ag layersSurface Science, 1980
- Evidence for longitudinal waves in electroreflectance spectroscopy of silverSurface Science, 1980
- Anomalous optical absorption of aggregated silver filmsThin Solid Films, 1973