Chemisorption Bonding ofChalcogen Overlayers on Ni(001)
- 20 August 1973
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 31 (8) , 540-542
- https://doi.org/10.1103/physrevlett.31.540
Abstract
Calculated low-energy electron diffraction spectra for overlayer structures of O, S, Se, and Te on Ni(001) show very good agreement with experiment for fourfold coordinated bonding sites and displacements of 0.90, 1.30, 1.45, and 1.90 ± 0.1 Å, respectively, from the center of the first layer of nickel atoms. These adsorbate-atom locations correspond to Ni-chalcogen bond lengths smaller than occur in bulk compounds, but comparable to those found in divalent Ni-chelate complexes.
Keywords
This publication has 3 references indexed in Scilit:
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- Low-Energy-Electron Diffraction from Several Surfaces of AluminumPhysical Review B, 1972
- Surface structures from low energy electron diffraction. (Overlayer systems)Journal of Physics C: Solid State Physics, 1972