A calculation of relaxation, migration and formation energies for surface defects in copper
- 31 October 1968
- journal article
- Published by Elsevier in Surface Science
- Vol. 12 (2) , 109-127
- https://doi.org/10.1016/0039-6028(68)90117-9
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
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- On the surface self-diffusion coefficientActa Metallurgica, 1965
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- Penetration depth of surface effects in molecular crystalsJournal of Physics and Chemistry of Solids, 1959
- Application of the Morse Potential Function to Cubic MetalsPhysical Review B, 1959
- Calculation of Migration and Binding Energies of Mono-, Di-, and Trivacancies in Copper with the Use of a Morse FunctionPhysical Review B, 1959
- Combined Pairs of Vacancies in CopperPhysical Review B, 1953