A Reflection Near-Field Scanning Optical Microscope Technique for Subwavelength Resolution Imaging of Thin Organic Films
- 1 July 1997
- journal article
- research article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry B
- Vol. 101 (29) , 5684-5691
- https://doi.org/10.1021/jp963856s
Abstract
No abstract availableKeywords
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