The use of x-ray topography for the observation and characterization of gross imperfections in sapphire single crystals
- 30 April 1967
- journal article
- Published by Elsevier in Materials Research Bulletin
- Vol. 2 (4) , 449-458
- https://doi.org/10.1016/0025-5408(67)90084-0
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Perfection of Ruby Laser CrystalsJournal of Applied Physics, 1965
- The projection topograph: a new method in X-ray diffraction microradiographyActa Crystallographica, 1959