Percolation threshold and mean grain size in AlxSi1-xthin films
Open Access
- 30 July 1985
- journal article
- Published by IOP Publishing in Journal of Physics C: Solid State Physics
- Vol. 18 (21) , L657-L660
- https://doi.org/10.1088/0022-3719/18/21/006
Abstract
The authors have determined the critical composition xc of the percolation threshold in polycrystalline AlxSi1-x thin films with a new method, using structural arguments only. The result xc=(0.55+or-0.05) agrees with the results of the commonly used methods. Moreover, the model explains the wide spread of experimental values of xc as reported in the literature.Keywords
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