Transferability of phase shifts for extended x-ray-absorption fine-structure studies of metal sulfides and sulfur on nickel surfaces
- 15 May 1992
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 45 (20) , 12043-12049
- https://doi.org/10.1103/physrevb.45.12043
Abstract
Extended x-ray-absorption fine-structure (EXAFS) spectra of α-MnS, CoS, α-NiS, β-NiS, , wurtzite ZnS, and GaS have been recorded at the S K edge. These temperature-dependent data together with Ni K-edge EXAFS from β-NiS are analyzed to investigate a breakdown of transferability in S-Ni EXAFS scattering phase shifts. A comparison of our data with theoretical calculations of the EXAFS indicates that the S-metal bond distance for CoS and β-NiS is underestimated by 0.07 Å, while all the remaining sulfides produce values within 0.02 Å of the bond lengths expected from x-ray diffraction. This explains discrepancies in the literature for EXAFS-derived surface S-Ni bond distances, some of which have employed S-Ni phase shifts transferred from β-NiS while others have used . The latter are found to give results agreeing with those of other surface structural techniques. We suggest a revision of published S-Ni distances for surface EXAFS of sulfur on Ni(100), Ni(110), and Ni(111). We point out that all determinations of surface structure using electron-scattering techniques will suffer from the same problems of inaccuracies of calculated phase shifts.
Keywords
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