Electronic Sputtering and Desorption Effects in TOF-SIMS Studies Using Slow Highly Charged Ions like Au69+
- 1 May 1997
- journal article
- Published by Trans Tech Publications, Ltd. in Materials Science Forum
- Vol. 248-249, 413-418
- https://doi.org/10.4028/www.scientific.net/msf.248-249.413
Abstract
No abstract availableKeywords
This publication has 0 references indexed in Scilit: