Sputtering of thin films of Pb(ZrTi)O 3

Abstract
Pb(ZrTi)O3 thin films of some selected Zr/Ti-ratios were produced by reactive dc diode sputtering and rftriode sputtering respectively. Films, which were sputtered at substrate temperatures of about 1000 K show the typical ferroelectric behaviour. An additional effect with thin ferroelectric Pb(ZrTi)O3 films is that the morphotropic phase boundary is shifted to higher concentrations of zirconium in the solid solution.