A microstructural study of crystalline defects in PbSe/BaF2/CaF2 on (111) Si grown by molecular beam epitaxy

This publication has 18 references indexed in Scilit:

• Lattice and thermal misfit dislocations in epitaxial ${\mathrm{CaF}}_2$/Si(111) and ${\mathrm{BaF}}_2$-${\mathrm{CaF}}_2$/Si(111) structures
  Physical Review Letters, 1992
• Photovoltaic infrared sensor arrays in monolithic lead chalcogenides on silicon
  Semiconductor Science and Technology, 1991
• Small-angle cleavage of semiconductors for transmission electron microscopy
  Ultramicroscopy, 1991
• HgCdTe on GaAs/Si for mid-wavelength infrared focal plane arrays
  Applied Physics Letters, 1990
• Characterization of epitaxial (Ca,Ba)F2 films on Si(111) substrates
  Applied Physics Letters, 1986
• Molecular beam epitaxy growth and applications of epitaxial fluoride films
  Journal of Vacuum Science & Technology A, 1986
• Low Temperature Surface Cleaning of Silicon and Its Application to Silicon MBE
  Journal of the Electrochemical Society, 1986
• Electrical Properties and Structural Defects in Epitaxial CaF₂ on Si
  MRS Proceedings, 1986
• Growth of high quality epitaxial PbSe onto Si using a (Ca,Ba)F2 buffer layer
  Applied Physics Letters, 1985
• Direct Measurements of the Surface Energies of Crystals
  Journal of Applied Physics, 1960