Increase of resistance to hot carriers in thin oxide MOSFETS

• 1 January 1985
• proceedings article
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 254-257
• https://doi.org/10.1109/iedm.1985.190944

Abstract

Keywords

• TESTING
• DEGRADATION
• VOLTAGE
• STRESS
• SURFACE RESISTANCE
• HOT CARRIERS
• STRESS TESTING
• ELECTRONS