Pulsed stress reliability investigations of schottky diodes and HBTS
- 1 November 1996
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 36 (11-12) , 1907-1910
- https://doi.org/10.1016/0026-2714(96)00226-0
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Failure mode analysis of
AlGaAs GaAs HBTs using electrostatic discharge methodSolid-State Electronics, 1995 - Molecular Beam Epitaxy of III-V Compounds: Technology and Growth ProcessAnnual Review of Materials Science, 1981
- Low-high-low profile gallium arsenide IMPATT reliabilityIEEE Transactions on Electron Devices, 1979