Characterization of Power MESFETs on 4h-SiC Conductive and Semi-Insulating Wafers

• 1 February 1998
• journal article
• Published by Trans Tech Publications, Ltd. in Materials Science Forum
• Vol. 264-268, 949-952
• https://doi.org/10.4028/www.scientific.net/msf.264-268.949

Abstract

Keywords

• DC AND RF CHARACTERIZATION
• MESFET
• THERMAL AND STORAGE CHARACTERIZATION