Visualization of thick specimens using a reflection acoustic microscope
- 1 March 1979
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 50 (3) , 1245-1249
- https://doi.org/10.1063/1.326144
Abstract
A reflection acoustic microscope may be used to image structural details under the apparent surface of a thick sample. To design such an apparatus, the geometrical parameters of the acoustic lenses must be carefully defined. The acoustic field distribution has been computed in the previous structure for this purpose. Some preliminary experimental results are also reported here.This publication has 4 references indexed in Scilit:
- Optimization of a transmission acoustic microscopeJournal of Applied Physics, 1978
- Investigation of some low ultrasonic absorption liquidsThe Journal of the Acoustical Society of America, 1976
- Integrated circuits as viewed with an acoustic microscopeApplied Physics Letters, 1974
- Acoustic microscope—scanning versionApplied Physics Letters, 1974