Polarization analyzing system for x-ray magnetic Kerr rotation in x-ray magnetic resonant scattering
- 1 July 1993
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 64 (7) , 1825-1830
- https://doi.org/10.1063/1.1144453
Abstract
We made a new polarization analyzing system for measuring a rotation of major axis of elliptical polarization in x‐ray magnetic resonant scattering. This system, based on a two‐axis diffractometer, is characterized by introducing a 45° linearly polarized x‐ray incident beam. Design and performance of the system are described. The rotation can be measured with precision of 0.2°–0.3° at the vicinity of Gd L3‐absorption edge where the maximum rotation is about −2°.Keywords
This publication has 10 references indexed in Scilit:
- X-ray Resonance Exchange Scattering Study of Nd2Fe14BJapanese Journal of Applied Physics, 1993
- Observation of X-ray Magnetic Kerr Rotation at Gd L Absorption EdgesJapanese Journal of Applied Physics, 1993
- X-Ray Resonance Exchange Scattering at the NdL2,3-Edges in Nd2Fe14BJournal of the Physics Society Japan, 1992
- X-ray optical activity and the Faraday effect in cobalt and its compoundsPhysical Review Letters, 1990
- X-Ray Resonance Exchange ScatteringPhysical Review Letters, 1988
- Polarization and Resonance Properties of Magnetic X-Ray Scattering in HolmiumPhysical Review Letters, 1988
- Polarization dependence of magnetic x-ray scatteringPhysical Review B, 1988
- X-Ray Resonance Magnetic ScatteringJournal of the Physics Society Japan, 1985
- Rotation of the Electric Vector of the Polarized X-Rays by Diffraction in CrystalsJapanese Journal of Applied Physics, 1981
- Tuneable polarizers for X-rays and neutronsPhilosophical Magazine Part B, 1979