Single event effects in pulse width modulation controllers
- 1 December 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 43 (6) , 2968-2973
- https://doi.org/10.1109/23.556893
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- TRENDS IN DEVICE SEE SUSCEPTIBILITY FROM HEAVY IONSPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Observation of single event upsets in analog microcircuitsIEEE Transactions on Nuclear Science, 1993
- Heavy Ion Induced Upsets in Semiconductor DevicesIEEE Transactions on Nuclear Science, 1985