Approximate solutions in multiple reflection time domain spectroscopy
- 1 July 1975
- journal article
- Published by AIP Publishing in The Journal of Chemical Physics
- Vol. 63 (1) , 68-73
- https://doi.org/10.1063/1.431098
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Multiple reflection time domain spectroscopy. II. A lumped element approach leading to an analytical solution for the complex permittivityThe Journal of Chemical Physics, 1975
- Evaluation of dielectric permittivity by time domain spectroscopyThe Journal of Physical Chemistry, 1975
- On the thin cell method in time domain spectroscopyChemical Physics Letters, 1974
- Dielectric response by real time analysis of time domain spectroscopy dataThe Journal of Physical Chemistry, 1974
- Evaluation of dielectric permittivity and conductivity by time domain spectroscopy. Mathematical analysis of Fellner-Feldegg's thin cell methodThe Journal of Chemical Physics, 1974
- Multiple reflection time domain spectroscopy. Application to dielectric relaxation properties of aqueous systems in the time range to 10–10to 10–4sJournal of the Chemical Society, Faraday Transactions 2: Molecular and Chemical Physics, 1974
- Thin-sample method for the measurement of permeability, permittivity, and conductivity in the frequency and time domainThe Journal of Physical Chemistry, 1972
- Measurement of the Intrinsic Properties of Materials by Time-Domain TechniquesIEEE Transactions on Instrumentation and Measurement, 1970