Double Failure and Other Related Problems in Standby Redundancy
- 1 February 1972
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. R-21 (1) , 35-40
- https://doi.org/10.1109/TR.1972.5216169
Abstract
A branch and bound algorithm is extended to parallel standby redundancy wherein components are subject to both open and short circuit failures. The algorithm is then modified to consider parallel-series arrangememts of such standbys, and is also applied to solving problems where there is a choice of components at each stage. In the last section, the two types of failures are separated in the constraints of the problems.Keywords
This publication has 4 references indexed in Scilit:
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