Further Application of the Intermediate X-Ray Probe
- 1 January 1958
- journal article
- Published by Cambridge University Press (CUP) in Advances in X-ray Analysis
- Vol. 2, 167-173
- https://doi.org/10.1154/s0376030800000495
Abstract
The electron probe is an extremely valuable tool for chemical analysis on a microscopic scale. There are many situations, however, that require analyses in the millimeter rather than micron range, where in fact, the use of the electron probe causes concern about sample homogeneity. The X-ray probe consisting of a small X-ray beam and focusing monochromator is very useful for this intermediate region. This X-ray probe is equally useful for electrically non-conducting as well as conducting specimens. Analysis need not be performed in vacuum and can be done with great rapidity. For example by traversing a polished section of a combination of opaque minerals, it was possible to determine the distribution of copper, silver, arsenic, iron, and mercury and to show that an unidentified mineral was a copper arsenic mineral rather than an arsenoargentite as had been supposed.Keywords
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