The Use of Ion Channeling Axial Scans in the Study of Ion-Implanted Al2O3
- 1 January 1984
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Near surface modification of α-Al2O3 by ion implantation followed by thermal annealingNuclear Instruments and Methods in Physics Research, 1983
- Ion implantation and thermal annealing of α-Al2O3 single crystalsJournal of Applied Physics, 1983
- Atom location in complex lattices: Pb in α-Al2O3Radiation Effects, 1980
- Plastic deformation of single crystals of sapphire: Basal slip and twinningActa Metallurgica, 1957