Special issue: Nanomanipulation of atoms

• 1 May 2000
• journal article
• editorial
• Published by Springer Nature in Applied Physics B Laser and Optics
• Vol. 70  (5) , 649
• https://doi.org/10.1007/s003400000309

Abstract

Keywords

• SCANNING PROBE MICROSCOPY
• LASER COOL
• MATTER WAVE
• HIGH PRECISION MEASUREMENT
• STRONG LOCALIZATION