Model calculations of the ellipsometric properties of inhomogeneous dielectric surfaces
- 14 February 1981
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 14 (2) , 115-126
- https://doi.org/10.1088/0022-3727/14/2/004
Abstract
Model calculations of the reflectivity ratio rp/rs are presented for various inhomogeneous surface dielectric profiles representing (i) liquid-vapour surfaces, (ii) liquid on solid surfaces, (iii) leached glass surfaces, as a function of the angle of incidence and the thickness of the inhomogeneous layer. The sensitivity of ellipsometric measurements to profile shape is analysed.Keywords
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