A Method for the Routine Measurement of Dielectric Photoconductivity

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Abstract
An instrumentation and data reduction technique for the routine analysis of dielectric photoconductivity data has been developed. This technique provides detailed conductivity versus time data during and shortly after an ionizing radiation pulse. Thus, it complements the timeintegral of conductivity technique, which can provide good long-term delayed conductivity data, and it offers some advantages over similar methods developed to measure conductivity. The unique features of this technique include the use of spline functions in the data reduction, the use of a sample designed to provide noise current cancellation, and circuit analysis that includes a mismatched transmission line.

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