TOF-SIMS investigation of metallic material surface after culturing cells
- 1 June 2004
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 231-232, 470-474
- https://doi.org/10.1016/j.apsusc.2004.03.181
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- TOF-SIMS Imaging of Protein Adsorption on Dialysis Membrane by means of Information Entropye-Journal of Surface Science and Nanotechnology, 2003
- Electrochemical properties of an interface between titanium and fibroblasts L929Electrochimica Acta, 2002
- Interpretation of Static Time-of-Flight Secondary Ion Mass Spectra of Adsorbed Protein Films by Multivariate Pattern RecognitionAnalytical Chemistry, 2002
- XPS Characterization of the Surface Oxide Film of 316L Stainless Steel Samples that were Located in Quasi-Biological EnvironmentsMATERIALS TRANSACTIONS, 2002
- Characterization of Adsorbed Protein Films by Time-of-Flight Secondary Ion Mass Spectrometry with Principal Component AnalysisLangmuir, 2001
- Fibronectin adsorption, conformation, and orientation on polystyrene substrates studied by radiolabeling, XPS, and ToF SIMSJournal of Biomedical Materials Research, 1998
- Chemical reactions induced in polymers by keV ions, electrons and photonsSurface and Interface Analysis, 1990
- A review of information theory in analytical chemometricsJournal of Chemometrics, 1990