Exponential order statistic models of software reliability growth
- 1 January 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Software Engineering
- Vol. SE-12 (1) , 12-24
- https://doi.org/10.1109/tse.1986.6312915
Abstract
Failure times of a software reliability growth process are modeled as order statistics of independent, nonidentically distributed exponential random variables. The Jelinsky-Moranda, Goel-Okumoto, Littlewood, Musa-Okumoto logarithmic, and power law models are all special cases of exponential order statistic models, but there are many additional examples as well. Various characterizations, properties, and examples of this class of models are developed and presented.Keywords
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