Measurement of AlAs/InP and InP/In0.52Al0.48As heterojunction band offsets by x-ray photoemission spectroscopy
- 1 July 1990
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B
- Vol. 8 (4) , 768-772
- https://doi.org/10.1116/1.584963
Abstract
No abstract availableThis publication has 0 references indexed in Scilit: