Computation of Dielectric Properties from Short-Circuited Waveguide Measurements on High- or Low-Loss Materials (Computer Program Descriptions)
- 1 March 1974
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 22 (3) , 342-343
- https://doi.org/10.1109/tmtt.1974.1128224
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Microwave Dielectric MeasurementsJournal of Applied Physics, 1947
- A New Method for Measuring Dielectric Constant and Loss in the Range of Centimeter WavesJournal of Applied Physics, 1946