First Symposium for Reliability in Multilayer Ceramic Capacitors
- 1 December 1989
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 72 (12) , 2221-2222
- https://doi.org/10.1111/j.1151-2916.1989.tb06065.x
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- An electrically excited acoustic emission test technique for screening multilayer ceramic capacitorsIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1988
- Accelerated life tests of ceramic capacitorsIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1988
- Highly accelerated life testing (HALT) for multilayer ceramic capacitor qualificationIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1988
- NEW DIRECTIONS FOR RELIABILITYQuality Engineering, 1988
- Thermally accelerated aging of semiconductor componentsProceedings of the IEEE, 1974