Pulsed soft x-ray source for laser-plasma diagnostic calibrations

Abstract
Improvement in laser-plasma analysis makes it necessary to perform accurate calibration in the soft x-ray range. For this purpose we have modified a plasma focus device (27 kJ, 40 kV, and 400 kA) in order to enhance its soft x-ray emission: A hollow anode is used to prevent hard x-ray bremsstrahlung emission, and a lot of filling gases are chosen for their characteristic lines in the keV and sub-keV range (Ne, Ar, O, N, and CH4). These emissions have been absolutely measured with an x-ray bolometer and can be used directly or indirectly (in the fluorescent mode: Mg Kα at 1.254 keV) for x-ray calibration of various diagnostics. Some detector calibrations in pulsed regime (10 ns) are presented [films, solid state Si doped p-intrinsic-n (PIN) diodes, and charge-coupled devices (CCD) arrays.]

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