PHOTODEPOPULATION OF ELECTRONS TRAPPED IN SiO2 ON SITES RELATED TO AS AND P IMPLANTATION
- 1 January 1978
- book chapter
- Published by Elsevier
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Some properties of the oxides of the tetrahedral semiconductors and the oxide–semiconductor interfacesa)Journal of Vacuum Science and Technology, 1977
- Conduction Studies in Silicon Nitride: Dark Currents and PhotocurrentsIBM Journal of Research and Development, 1977
- Determination of insulator bulk trapped charge densities and centroids from photocurrent-voltage charactersitcs of MOS structuresJournal of Applied Physics, 1976
- Electronic structure, spectra, and properties of 4:2-coordinated materials. I. Crystalline and amorphousandPhysical Review B, 1976
- Avalanche Injection of Electrons into Insulating SiO2 Using MOS StructuresJournal of Applied Physics, 1970