Interpretation of “true atomic resolution” images of graphite (0001) in noncontact atomic force microscopy
- 15 September 2000
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 62 (11) , 6967-6970
- https://doi.org/10.1103/physrevb.62.6967
Abstract
To examine the contrast formation by noncontact atomic force microscopy (NC-AFM), we simulate images of graphite (0001) and compare them with experimental results. Important features of the experimental data like the appearance of a trigonal structure with a distance of 2.46 Å between the maxima and the experimental corrugation amplitudes are well reproduced. The detailed analysis shows that the NC-AFM images reveal the positions of the carbon atoms as minima and the hollow sites as maxima, in contrast to a simple interpretation of NC-AFM data.Keywords
This publication has 28 references indexed in Scilit:
- Separation of interactions by noncontact force microscopyPhysical Review B, 2000
- Physical interpretation of frequency-modulation atomic force microscopyPhysical Review B, 2000
- Dynamic scanning force microscopy at low temperatures on a noble-gas crystal: Atomic resolution on the xenon(111) surfaceEurophysics Letters, 1999
- Model of noncontact scanning force microscopy on ionic surfacesPhysical Review B, 1999
- A scanning force microscope with atomic resolution in ultrahigh vacuum and at low temperaturesReview of Scientific Instruments, 1998
- Role of Covalent Tip-Surface Interactions in Noncontact Atomic Force Microscopy on Reactive SurfacesPhysical Review Letters, 1997
- Atomic-scale friction image of graphite in atomic-force microscopyPhysical Review B, 1996
- Effect of the tip structure on atomic-force microscopyPhysical Review B, 1995
- Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force MicroscopyScience, 1995
- Simple theory for the atomic-force microscope with a comparison of theoretical and experimental images of graphitePhysical Review B, 1989