A note on 3-state systems
- 1 January 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. 38 (3) , 277-278
- https://doi.org/10.1109/24.44167
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- On a common error in open and short circuit reliability computationIEEE Transactions on Reliability, 1989
- Optimal 'series-parallel' networks of 3-state devicesIEEE Transactions on Reliability, 1988
- Open & Short Circuit Reliability of Systems of Identical ItemsIEEE Transactions on Reliability, 1986