Spectrometer for soft x-ray emission studies of liquid metals and metallic vapors
- 1 May 1980
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 51 (5) , 621-625
- https://doi.org/10.1063/1.1136267
Abstract
An x‐ray spectrometer based on the Johann bent‐crystal principle is described. An entrance slit system has been adopted which provides excellent protection of the diffracting crystal from metallic vapors. Such an arrangement also provides improved resolution and dispenses with the need for a thin film window between the x‐ray source and spectrometer tank. Resolution comparable to a two plane‐crystal instrument has been attained and systematic studies of the soft x‐ray emissions from liquid metals and alloys and metallic vapors undertaken.Keywords
This publication has 9 references indexed in Scilit:
- The Lβ1 and Lα1, 2 x-ray emission lines from free zinc atoms and zinc metalPhysics Letters A, 1978
- X-Ray Spectra of Free AtomsJapanese Journal of Applied Physics, 1978
- Purification of Latex SuspensionsJapanese Journal of Applied Physics, 1978
- Si KαX-ray emission spectra of Si, SiC, SiO2and Si3N4Journal of Physics B: Atomic and Molecular Physics, 1977
- A simple bent crystal X-ray scanning spectrometerJournal of Physics E: Scientific Instruments, 1977
- A double-focusing soft X-ray spectrometer with independent adjustment of Bragg and observation anglesJournal of Physics E: Scientific Instruments, 1976
- Quantitative low-energy x-ray spectroscopy (50–100-Å region)Journal of Applied Physics, 1976
- X-Ray Diffraction by Elastically Deformed CrystalsJournal of Applied Physics, 1950
- Die Erzeugung lichtstarker Röntgenspektren mit Hilfe von KonkavkristallenThe European Physical Journal A, 1931