An improved approach and experimental results of a low-frequency noise measurement technique used for reliability estimation of diode lasers
- 1 July 1994
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 34 (7) , 1261-1264
- https://doi.org/10.1016/0026-2714(94)90512-6
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Leakage currents and 1/fnoise in buried InGaAsP/InP heterostructure lasersSoviet Journal of Quantum Electronics, 1990
- Wavelength dependence of 1/f noise in the light output of laser diodes: an experimental studyIEEE Journal of Quantum Electronics, 1990
- Deep-level impurity analysis for p-n junctions of a bipolar transistor from low-frequency g-r noise measurementsSolid-State Electronics, 1989