Radiation damage in the TEM and SEM
Top Cited Papers
- 1 August 2004
- Vol. 35 (6) , 399-409
- https://doi.org/10.1016/j.micron.2004.02.003
Abstract
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This publication has 33 references indexed in Scilit:
- The Lateral Range and Energy Deposition of Fast Secondary ElectronsMicroscopy and Microanalysis, 2004
- Plasma Cleaning and Its Applications for Electron MicroscopyMicroscopy and Microanalysis, 1999
- Parallel electron energy-loss spectroscopy and X-ray photoelectron spectroscopy of poly(ether ether ketone)Polymer, 1993
- Cryoprotection in electron microscopyJournal of Microscopy, 1986
- High resolution electron microscopy of molecular crystals III. Radiation processes at room temperatureProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1984
- Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solidsSurface and Interface Analysis, 1979
- Sputtering of gold foils in a high voltage electron microscope A comparison of theory and experimentPhilosophical Magazine, 1977
- Sputtering in the high voltage electron microscopeNuclear Instruments and Methods, 1976
- Reduction in electron irradiation damage to organic compounds by conducting coatingsPhilosophical Magazine, 1974
- The electric charging of electron-microscope specimensJournal of Physics D: Applied Physics, 1969