Infrared external reflection spectroscopy of self-assembled monolayer films on Si substrate with a buried metal layer (BML) structure
- 1 July 1996
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 100-101, 407-411
- https://doi.org/10.1016/0169-4332(96)00309-1
Abstract
No abstract availableThis publication has 24 references indexed in Scilit:
- External reflection infrared spectroscopy at metallic, semiconductor, and nonmetallic substrates. 1. Monolayer filmsThe Journal of Physical Chemistry, 1993
- Infrared reflection absorption spectroscopy of adsorbates on semiconductors with buried metal layers — O2/GaAsSurface Science, 1991
- Infrared reflection-absorption spectroscope using thin film structuresSpectrochimica Acta Part A: Molecular Spectroscopy, 1990
- Infrared reflectance properties of surface thin filmsThe Journal of Physical Chemistry, 1989
- Fourier transform infrared external reflection study of molecular orientation in spontaneously adsorbed layers on low-absorption substratesThe Journal of Physical Chemistry, 1989
- Surface infrared spectroscopySurface Science Reports, 1988
- IR absorption from CO molecules adsorbed onto superlatticesSuperlattices and Microstructures, 1987
- Quantitative aspects of infrared external reflection spectroscopy: polymer/glassy carbon interfaceAnalytical Chemistry, 1986
- Infrared reflection-absorption spectroscopy of adsorbed moleculesSurface Science Reports, 1983
- Infrared Study of Adsorbed Molecules on Metal Surfaces by Reflection TechniquesThe Journal of Chemical Physics, 1966