With the realization of simultaneous temporal and spectral multiplexing in the infrared using Fourier Transform Spectrometers, it is possible to study entirely new classes of problems which were not generally accessible to infrared techniques before. Now it is possible to simultaneously obtain high spectral resolution and realize spectral signal to noise normally associated with spectrally multiplexed systems on transient samples whose lifetimes are orders of magnitude shorter than the time required to collect one interferogram. Results of time resolved spectral studies are presented with a discussion of the gains in signal to noise one realizes over rapid scan devices.