Direct imaging of surface cusp evolution during strained-layer epitaxy and implications for strain relaxation
- 13 September 1993
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 71 (11) , 1744-1747
- https://doi.org/10.1103/physrevlett.71.1744
Abstract
We have directly imaged the evolution of surface cusps during strained-layer epitaxy. The cusps arise naturally as a result of gradients in the surface chemical potential. High stress concentrations at the cusp tip have important implications for strain relaxation in the film via dislocation nucleation.Keywords
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