Analysis of a two-unit repairable system with random inspection subject to two types of failure
- 1 January 1983
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 23 (3) , 449-451
- https://doi.org/10.1016/0026-2714(83)91171-x
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Cost—benefit analysis of a one-server two-unit cold standby system subject to inspectionMicroelectronics Reliability, 1982
- Some Applications of Regenerative Stochastic Processes to Reliability Theory?Part Two: Reliability and Availability of 2-Item Redundant SystemsIEEE Transactions on Reliability, 1975
- Some Applications of Regenerative Stochastic Processes to Reliability TheoryߞPart One: Tutorial IntroductionIEEE Transactions on Reliability, 1974