Abstract
The orientation of surface grains in a thick crystalline specimen can be determined by means of a Kossel line technique. In this work the Kossel lines are recorded on a cylindrical film coaxial with the electron beam of an electron probe microanalyzer. These Kossel lines are analyzed by a mathematical technique to reveal the orientation of a grain. The technique will also yield a rough crystal analysis of unknown materials; therefore, it may be useful in analyzing inclusions and precipitates in solid specimens.

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